GaN surface sputter damage investigated using deep level transient spectroscopy

High Resolution Laplace Deep Level Transient Spectroscopy a New Tool to Study Implant Damage in Silicon

Several recent studies indicate that there are major differences in the defect population between ion implanted and electron damaged silicon. The differences are more marked as the ion mass and the implant energy increase. This paper reviews work that has been done using high resolution (Laplace) Deep Level Transient Spectroscopy (DLTS) to try to understand the differences between the defect sp...

Characterization of deep defects in CdSyCdTe thin film solar cells using deep level transient spectroscopy

The presence of deep defects in CdSyCdTe thin film solar cells strongly affects the electrical properties and as a result the performance of the cells. Therefore, it is desirable to understand the role of these defect states. This paper describes the detection of electron traps in CdSyCdTe thin film solar cells using deep level transient spectroscopy. Two series of samples with a different acti...

Multiple-level-defect Measurements Using Fundamental Frequency Deep Level Transient Spectroscopy: a New Measurement Technique

A first principles analysis, of two multiple-level-defect systems, yields differential rate equations from which a multiple-defect-level solution, derived without approximation, is applied to the experimental analysis of level depth. In terms of semiconductor material characterization, this exact solution including the full set of carrier transitions is shown to provide more detailed informatio...

Deep Level Transient Spectroscopy in Quantum Dot Characterization

Deep level transient spectroscopy (DLTS) for investigating electronic properties of self-assembled InAs/ GaAs quantum dots (QDs) is described in an approach, where experimental and theoretical DLTS data are compared in a temperature-voltage representation. From such comparative studies, the main mechanisms of electron escape from QD-related levels in tunneling and more complex thermal processes...

Magnetron Sputter Epitaxy of GaN